The walk-in high and low temperature (humid and hot) laboratory also needs maintenance
Reminder: Remember to maintain the walk-in high and low temperature (humid and hot) laboratory as well!
1. The temperature and humidity testing system of the walk-in high and low temperature (humid and hot) laboratory must be operated and maintained by a dedicated person. Strictly follow the operating procedures of the system and avoid others from operating the system illegally.
2. Long term shutdown of the walk-in high and low temperature (humid and hot) laboratory can affect the effective service life of the system. Therefore, the system should be turned on and operated at least once every 10 days; Do not repeatedly stop the system in a short period of time. The number of starts per hour should be less than 5 times, and the time interval between each start stop should not be less than 3 times; Do not open the door of the walk-in temperature and humidity testing system at low temperatures to prevent damage to the door sealing tape.
3. A system usage file should be established to facilitate system maintenance and repair. The use of archives should record the start and end time (date) of each system operation, the type of experiment, and the ambient temperature; When the system malfunctions, provide a detailed description of the fault phenomenon as much as possible; The maintenance and repair of the system should also be recorded in as much detail as possible.
4. Conduct a monthly main power switch (leakage circuit breaker) operation test to ensure that the switch is used as a leakage protector while meeting the load capacity. The specific steps are as follows: first, please confirm that the main power switch is turned to "ON", which means the system is powered on, and then press the test button. If the switch lever of the residual current circuit breaker falls down, this function is normal.
5. The main box of the walk-in temperature and humidity testing system should be protected during use and should not be subjected to strong impacts from sharp or blunt objects.
6. To ensure the normal and clean supply of cooling water, the cooling water filter of the refrigeration unit should be cleaned every 30 days. If the local air quality is poor and the dust content in the air is high, the cooling water tower reservoir should generally be cleaned every 7 days.
7. The leakage, overload, and short-circuit protection characteristics of the residual current switch are set by Lab Companion manufacturer and cannot be adjusted arbitrarily during use to avoid affecting performance; After the leakage switch is disconnected due to a short circuit, the contacts need to be checked. If the main contacts are severely burned or have pits, maintenance is required.
8. The test products placed in the walk-in temperature and humidity testing system should be kept at a certain distance from the suction and exhaust ports of the air conditioning channel to avoid obstructing air circulation.
9. Overtemperature protector action test. Set the temperature of the over temperature protector to be lower than the temperature of the box. If there is an E0.0 alarm and buzzing sound, it indicates that its function is normal. After completing the above experiment, the temperature protection setting should be reset appropriately, otherwise it may cause inappropriate termination.
10. Once a year, use a vacuum cleaner to clean and remove dust from the distribution room and water circuit room. Once a month, use a dry cloth to clean the accumulated water in the water tray of the refrigeration unit.
Concentrator Solar Cell
A concentrating solar cell is a combination of [Concentrator Photovoltaic]+[Fresnel Lenes]+[Sun Tracker]. Its solar energy conversion efficiency can reach 31% ~ 40.7%, although the conversion efficiency is high, but due to the long sunward time, it has been used in the space industry in the past, and now it can be used in the power generation industry with sunlight tracker, which is not suitable for general families. The main material of concentrating solar cells is gallium arsenide (GaAs), that is, the three five group (III-V) materials. General silicon crystal materials can only absorb the energy of 400 ~ 1,100nm wavelength in the solar spectrum, and the concentrator is different from silicon wafer solar technology, through the multi-junction compound semiconductor can absorb a wider range of solar spectrum energy, and the current development of three-junction InGaP/GaAs/Ge concentrator solar cells can greatly improve the conversion efficiency. The three-junction concentrating solar cell can absorb energy of 300 ~ 1900nm wavelength relative to its conversion efficiency can be greatly improved, and the heat resistance of concentrating solar cells is higher than that of general wafer-type solar cells.
Temperature and Humidity Terms
Dew Point temperature Td, in the air water vapor content unchanged, maintain a certain pressure, so that the air cooling to reach saturation temperature called dew point temperature, referred to as dew point, the unit is expressed in ° C or ℉. It's actually the temperature at which water vapor and water are in equilibrium. The difference between the actual temperature (t) and the dew point temperature (Td) indicates how far the air is saturated. When t>Td, it means that the air is not saturated, when t=Td, it is saturated, and when t<Td, it is supersaturated.
dew is the liquid water in the air that condenses on the ground. In the evening or at night, due to the radiation cooling of the ground or ground objects, the air layer close to the surface will also cool down. When the temperature drops below the dew point, that is, when the water vapor content in the air is susaturated, there will be condensation of water vapor on the surface of the ground or ground objects. If the dew point temperature is above 0 ° C at this time, tiny water droplets appear on the ground or ground objects, which are called dew.
frost refers to the white ice crystals formed on the ground or objects after the air close to the ground is cooled to the frost point (meaning the dew point is below 0) under the influence of radiation cooling on the ground.
fog refers to the condensation of water vapor suspended in the atmosphere near the Earth's surface, composed of small water droplets or ice crystals. When the temperature reaches the dew point temperature (or is close to the dew point), the water vapor in the air condenses to form fog.
snow is solid water in the form of snowflakes that falls to the ground from mixed clouds. Precipitation consisting of a large number of white opaque ice crystals (snow crystals) and their polymers (snow masses). Snow is the natural phenomenon of water condensing and falling in the air, or falling snow;
There is a limit to the amount of water vapor that can be contained in a unit volume of air under a certain pressure and a certain temperature. If the water vapor contained in the volume of air exceeds this limit, the water vapor will condense and produce precipitation, and the actual value of water vapor in the volume of air. In terms of absolute humidity. The more water vapor there is, the higher the absolute humidity of the air.
Relative Humidity refers to the percentage of water vapor pressure in the air and saturated water vapor pressure at the same temperature, or the ratio of the absolute humidity of wet air to the maximum absolute humidity that can be reached at the same temperature, and can also be expressed as the ratio of the partial pressure of water vapor in wet air to the saturation pressure of water at the same temperature.
Humidity: wet and dry bulb measurement
The dry and wet bulb thermometer is used to detect the [relative humidity] in the air, the dry bulb temperature is the temperature measured by the general temperature sensor, and the wet bulb temperature is tied on the temperature sensor with a wet cloth, and then soaked in a small cup of water, so that the water is wrapped in the whole sensor, because the relative humidity in the air must be less than or equal to 100% (the water vapor in the air is not saturated). Therefore, the moisture of the wet bulb will be evaporated, and the heat will be taken away during evaporation, resulting in a drop in the wet bulb temperature (the dry bulb temperature is the real air temperature), which means that the greater the difference in the readings of the dry and wet bulb thermometer, the more vigorous the evaporation of water, and the smaller the relative humidity in the air, as long as the temperature of the dry and wet bulb is measured, Then compare [relative humidity table] you can know the relative humidity of the environment at that time.
Maintenance of refrigeration compressor for constant temperature and humidity test chamber, cold and hot shock test chamber
Article summary: For environmental monitoring equipment, the only way to maintain long-term and stable use is to pay attention to maintenance in all aspects. Here, we will introduce the maintenance of the compressor, which is an important component of the constant temperature and humidity test chamber and the cold and hot shock test chamber
Detailed content:
Maintenance plan for refrigeration compressor:
As the core component of the refrigeration system in the constant temperature and humidity test chamber, the maintenance of the compressor is essential. Guangdong Hongzhan Technology Co., Ltd. introduces the daily maintenance steps and precautions for the compressor in the constant temperature and humidity test chamber and the cold and hot shock test chamber
1、 Carefully check the sound of the cylinders and moving parts at all levels to determine if their working condition is normal. If any abnormal sound is found, immediately stop the machine for inspection;
2、 Pay attention to whether the indicated values of pressure gauges at all levels, pressure gauges on gas storage tanks and coolers, and lubricating oil pressure gauges are within the specified range;
3、 Check if the temperature and flow rate of the cooling water are normal;
4、 Check the supply of lubricating oil and the lubrication system of the moving mechanism (some compressors are equipped with organic glass baffles on the side of the cross head guide rail of the machine body),
You can directly see the movement of the crosshead and the supply of lubricating oil; The cylinder and packing can be inspected for oil discharge using a one-way valve, which can check if the oil injector is inserted into the cylinder
Oil injection situation;
5、 Observe whether the oil level in the body oil tank and the lubricating oil in the oil injector are below the scale line. If they are low, they should be refilled in a timely manner (if using a dipstick, stop and check);
6、 Check the temperature of the intake and exhaust valve covers at the cross guide rail of the crankcase with your hand to see if it is normal;
7、 Pay attention to the temperature rise of the motor, bearing temperature, and whether the readings on the voltmeter and ammeter are normal. The current should not exceed the rated current of the motor. If it exceeds the rated current, the cause should be identified or the machine should be stopped for inspection;
8、 Regularly check whether there are any debris or conductive objects inside the motor, whether the coil is damaged, and whether there is friction between the stator and rotor, otherwise the motor will burn out after starting;
9、 If it is a water-cooled compressor and water cannot be immediately supplied after the water is cut off, it is necessary to avoid cylinder cracking due to uneven heating and cooling. After parking in winter, the cooling water should be drained to prevent freezing and cracking of the cylinder and other parts;
10、 Check whether the compressor vibrates and whether the foundation screws are loose or detached;
11、 Check whether the pressure regulator or load regulator, safety valve, etc. are sensitive;
12、 Pay attention to the hygiene of the compressor, its associated equipment, and the environment;
13、 Gas storage tanks, coolers, and oil-water separators should regularly release oil and water;
14、 The lubricating machine used should be filtered by sedimentation. Differentiate the use of compressor oil between winter and summer
EC-105HTP,MTP,MTHP, High and low temperature constant temperature bath (1000L)
Project
Type
Series
ＨＴ
ＭＴ
ＭＴＨ
function
Temperature occurs in a way
Dry wet bulb method
Temperature range
-20 ～ + 100 ℃
-40 ～ + 100 ℃
-40 ～ + 150 ℃
Range of temperature
Below the + 100℃
± 0.3 ℃
+Above the 101℃
―
± 0.5 ℃
Temperature distribution
Below the + 100℃
± 1.0 ℃
Above the + 101℃
―
± 2.0 ℃
The temperature drops the time
+20 ～ -20 ℃
Within 60 minutes
+20 ～ -40 ℃
Within 9 0 minutes
+20 ～ -40 ℃
Within 9 0 minutes
Temperature rise time
-20 ～ + 100 ℃
Within 45 minutes
-40 ～ + 100 ℃
Within 50 minutes
-40 ～ + 150 ℃
Within 75 minutes
The internal volume of the uterus was tested
1000Ｌ
Test room inch method (width, depth and height)
1000mm × 1000mm × 1000mm
Product inch method (width, depth and height)
1400mm × 1370mm × 1795mm
Make the material
External outfit
Test room control panel
machine room
Cold steel plate, cold steel plate beige
(Color table 2.5Y8 / 2)
Inside
Stainless steel plate (SUS304,2B polished)
Broken heat material
Test room
Hard synthetic resin
―
glass wool
door
Hard synthetic resin foam cotton, glass cotton
Project
Type
Series
ＨＴ
ＭＴ
ＭＴＨ
Cooling dehumidifying device
Cooling-down method
Mechanical section shrinkage mode
Cooling medium
Ｒ４０４Ａ
compressor
Output (number of units)
0.75kW （１）
1.5kW （１）
Cooling and dehumidifier
Multi-channel mixed heat sink type
The condenser
Multi-channel mixed radiator plate type (air cooling type)
Calorifier
Form
Nickel-chromium heat-resistant alloy heater
Volume
3.5kW
Blower
Form
Multi-channel mixed radiator plate type (air cooling type)
Motor capacity
40W
Controller
The temperature is set
-22.0 ～ + 102.0 ℃
-42.0 ～ + 102.0 ℃
-42.0 ～ + 152.0 ℃
Humidity is set
0 ～ 98%RH （But the temperature of the wet and dry bulb is 10-85 ℃ ）
Time setting Fanny
0 ~ 999 Time 59 minutes (formula) 0 ~ 20000 Time 59 minutes (formula formula)
Set decomposition energy
Temperature 0.1℃, humidity 1% RH for 1 min
Indicate accuracy
Temperature ± 0.8℃ (tp.), humidity ± 1% RH (tp.), time ± 100 PPM
Vacation type
Value or program
Stage number
20-stage / 1 program
The number of procedures
The maximum number of incoming force (RAM) programs is 32 programs
The maximum number of internal ROM programs is 13 programs
Round-trip number
98 times maximum or unlimited
Number of round-trip repeats
Maximum 3 times
Displace the end
Pt 100Ω（at 0 ℃）， gradeＢ（JIS C 1604-1997）
Control action
When splitting the PID action
Endovirus function
Early delivery function, standby function, setting value maintenance function, power outage protection function,
Power action selection function, maintenance function, transportation round-trip function,
Time delivery function, time signal output function, overrising and overcooling prevention function,
Abnormal representation function, external alarm output function, setting paradigm representation function,
Transport type selection function, the calculation time represents the function, the slot lamp lamp function
Project
Type
Series
ＨＴ
ＭＴ
ＭＴＨ
Control panel
Equipment machine
LCD operating panel (type contact panel),
Represents lamp (power, transport, abnormal), test power supply terminal, external alarm terminal,
Time signal output terminal, power cord connector
Protective device
Refrigerating cycle
Overload protection device, high blocking device
Calorifier
Temperature over-rise protection device, temperature fuse
Blower
Overload protection device
Control panel
Leakage breaker for power supply, fuse (for heater, humidifier),
Fuse (for operating loop), temperature rise protection device (for testing),
Temperature rise overcooling prevention device (test material, in microcomputer)
Offproducts (sets)
House receiving (4), house board (2), operation instructions (1)
Equipment products
Adventitia
hard borosilicate glass 270mm× 190mm
２
Cable hole
内径 50mm
１
The trough inside the lamp
AC100V 15W White hot ball
２
Wheel
４
Horizontal adjustment
４
Electrovirus characteristics
Source *
AC three-phase 380V 50Hz
Maximum load current
13A
15A
Capacity of the leakage breaker for the power supply
25 A
Sensory current 30mA
Power distribution thickness
8mm2
14mm2
Rubber insulation hose
Coarseness of grounding wire
3.5mm2
5.5mm2
Tubing
drain-pipe *
PT1/2
Product weight
470kg
540kg
Conduction Zone of Heat
Thermal conductivity
It is the thermal conductivity of a substance, passing from high temperature to low temperature within the same substance. Also known as: thermal conductivity, thermal conductivity, thermal conductivity, heat transfer coefficient, heat transfer, thermal conductivity, thermal conductivity, thermal conductivity, thermal conductivity.
Thermal conductivity formula
k = (Q/t) *L/(A*T) k: thermal conductivity, Q: heat, t: time, L: length, A: area, T: temperature difference in SI units, the unit of thermal conductivity is W/(m*K), in imperial units, is Btu · ft/(h · ft2 · °F)
Heat transfer coefficient
In thermodynamics, mechanical engineering and chemical engineering, the heat conductivity is used to calculate the heat conduction, mainly the heat conduction of convection or the phase transformation between fluid and solid, which is defined as the heat through the unit area per unit time under the unit temperature difference, called the heat conduction coefficient of the substance, if the thickness of the mass of L, the measurement value to be multiplied by L, The resulting value is the coefficient of thermal conductivity, usually denoted as k.
Unit conversion of heat conduction coefficient
1 (CAL) = 4.186 (j), 1 (CAL/s) = 4.186 (j/s) = 4.186 (W).
The impact of high temperature on electronic products:
The rise in temperature will cause the resistance value of the resistor to decrease, but also shorten the service life of the capacitor, in addition, the high temperature will cause the transformer, the performance of the related insulation materials to decrease, the temperature is too high will also cause the solder joint alloy structure on the PCB board to change: IMC thickens, solder joints become brittle, tin whisker increases, mechanical strength decreases, junction temperature increases, the current amplification ratio of transistor increases rapidly, resulting in collector current increases, junction temperature further increases, and finally component failure.
Explanation of proper terms:
Junction Temperature: The actual temperature of a semiconductor in an electronic device. In operation, it is usually higher than the Case Temperature of the package, and the temperature difference is equal to the heat flow multiplied by the thermal resistance. Free convection (natural convection) : Radiation (radiation) : Forced Air(gas cooling) : Forced Liquid (gas cooling) : Liquid Evaporation: Surface Surroundings Surroundings
Common simple considerations for thermal design:
1 Simple and reliable cooling methods such as heat conduction, natural convection and radiation should be used to reduce costs and failures.
2 Shorten the heat transfer path as much as possible, and increase the heat exchange area.
3 When installing components, the influence of radiation heat exchange of peripheral components should be fully considered, and the thermal sensitive devices should be kept away from the heat source or find a way to use the protective measures of the heat shield to isolate the components from the heat source.
4 There should be sufficient distance between the air inlet and the exhaust port to avoid hot air reflux.
5 The temperature difference between the incoming air and the outgoing air should be less than 14 ° C.
6 It should be noted that the direction of forced ventilation and natural ventilation should be consistent as far as possible.
7 Devices with large heat should be installed as close as possible to the surface that is easy to dissipate heat (such as the inner surface of the metal casing, metal base and metal bracket, etc.), and there is good contact heat conduction between the surface.
8 Power supply part of the high-power tube and rectifier bridge pile belong to the heating device, it is best to install directly on the housing to increase the heat dissipation area. In the layout of the printed board, more copper layers should be left on the board surface around the larger power transistor to improve the heat dissipation capacity of the bottom plate.
9 When using free convection, avoid using heat sinks that are too dense.
10 The thermal design should be considered to ensure that the current carrying capacity of the wire, the diameter of the selected wire must be suitable for the conduction of the current, without causing more than the allowable temperature rise and pressure drop.
11 If the heat distribution is uniform, the spacing of the components should be uniform to make the wind flow evenly through each heat source.
12 When using forced convection cooling (fans), place the temperature-sensitive components closest to the air intake.
13 The use of free convection cooling equipment to avoid arranging other parts above the high power consumption parts, the correct approach should be uneven horizontal arrangement.
14 If the heat distribution is not uniform, the components should be sparsely arranged in the area with large heat generation, and the component layout in the area with small heat generation should be slightly denser, or add a diversion bar, so that the wind energy can effectively flow to the key heating devices.
15 The structural design principle of the air inlet: on the one hand, try to minimize its resistance to the air flow, on the other hand, consider dust prevention, and comprehensively consider the impact of the two.
16 Power consumption components should be spaced as far apart as possible.
17 Avoid crowding temperature sensitive parts together or arranging them next to high power consuming parts or hot spots.
18 The use of free convection cooling equipment to avoid arranging other parts above the high power consumption parts, the correct practice should be uneven horizontal arrangement.
Temperature Cyclic Stress Screening (1)
Environmental Stress Screening (ESS)
Stress screening is the use of acceleration techniques and environmental stress under the design strength limit, such as: burn in, temperature cycling, random vibration, power cycle... By accelerating the stress, the potential defects in the product emerge [potential parts material defects, design defects, process defects, process defects], and eliminate electronic or mechanical residual stress, as well as eliminate stray capacitors between multi-layer circuit boards, the early death stage of the product in the bath curve is removed and repaired in advance, so that the product through moderate screening, Save the normal period and decline period of the bathtub curve to avoid the product in the process of use, the test of environmental stress sometimes lead to failure, resulting in unnecessary losses. Although the use of ESS stress screening will increase the cost and time, for improving the product delivery yield and reduce the number of repairs, there is a significant effect, but for the total cost will be reduced. In addition, customer trust will also be improved, generally for electronic parts of the stress screening methods are pre-burning, temperature cycle, high temperature, low temperature, PCB printed circuit board stress screening method is temperature cycle, for the electronic cost of the stress screening is: Power pre-burning, temperature cycling, random vibration, in addition to the stress screen itself is a process stage, rather than a test, screening is 100% of the product procedure.
Stress screening applicable product stage: R & D stage, mass production stage, before delivery (screening test can be carried out in components, devices, connectors and other products or the whole machine system, according to different requirements can have different screening stress)
Stress screening comparison:
a. Constant high temperature pre-burning (Burn in) stress screening, is the current electronic IT industry commonly used method to precipitate electronic components defects, but this method is not suitable for screening parts (PCB, IC, resistor, capacitor), According to statistics, the number of companies in the United States that use temperature cycling to screen parts is five times more than the number of companies that use constant high temperature prefiring to screen components.
B. GJB/DZ34 indicates the proportion of temperature cycle and random vibrating screen selection defects, temperature accounted for about 80%, vibration accounted for about 20% of the defects in various products.
c. The United States has conducted a survey of 42 enterprises, random vibration stress can screen out 15 to 25% of the defects, while the temperature cycle can screen out 75 to 85%, if the combination of the two can reach 90%.
d. The proportion of product defect types detected by temperature cycling: insufficient design margin: 5%, production and workmanship errors: 33%, defective parts: 62%
Description of fault induction of temperature cyclic stress screening:
The cause of product failure induced by temperature cycling is: when the temperature is cycled within the upper and lower extremal temperatures, the product produces alternating expansion and contraction, resulting in thermal stress and strain in the product. If there is a transient thermal ladder (temperature non-uniformity) within the product, or the thermal expansion coefficients of adjacent materials within the product do not match each other, these thermal stresses and strains will be more drastic. This stress and strain is greatest at the defect, and this cycle causes the defect to grow so large that it can eventually cause structural failure and generate electrical failure. For example, a cracked electroplated through-hole eventually cracks completely around it, causing an open circuit. Thermal cycling enables soldering and plating through holes on printed circuit boards... Temperature cyclic stress screening is especially suitable for electronic products with printed circuit board structure.
The fault mode triggered by the temperature cycle or the impact on the product is as follows:
a. The expansion of various microscopic cracks in the coating, material or wire
b. Loosen poorly bonded joints
c. Loosen improperly connected or riveted joints
d. Relax the pressed fittings with insufficient mechanical tension
e. Increase the contact resistance of poor quality solder joints or cause an open circuit
f. Particle, chemical pollution
g. Seal failure
h. Packaging issues, such as bonding of protective coatings
i. Short circuit or open circuit of the transformer and coil
j. The potentiometer is defective
k. Poor connection of welding and welding points
l. Cold welding contact
m. Multi-layer board due to improper handling of open circuit, short circuit
n. Short circuit of power transistor
o. Capacitor, transistor bad
p. Dual row integrated circuit failure
q. A box or cable that is nearly short-circuited due to damage or improper assembly
r. Breakage, breakage, scoring of material due to improper handling... Etc.
s. out-of-tolerance parts and materials
t. resistor ruptured due to lack of synthetic rubber buffer coating
u. The transistor hair is involved in the grounding of the metal strip
v. Mica insulation gasket rupture, resulting in short circuit transistor
w. Improper fixing of the metal plate of the regulating coil leads to irregular output
x. The bipolar vacuum tube is open internally at low temperature
y. Coil indirect short circuit
z. Ungrounded terminals
a1. Component parameter drift
a2. Components are improperly installed
a3. Misused components
a4. Seal failure
Introduction of stress parameters for temperature cyclic stress screening:
The stress parameters of temperature cyclic stress screening mainly include the following: high and low temperature extremum range, dwell time, temperature variability, cycle number
High and low temperature extremal range: the larger the range of high and low temperature extremal, the fewer cycles required, the lower the cost, but can not exceed the product can withstand the limit, do not cause new fault principle, the difference between the upper and lower limits of temperature change is not less than 88°C, the typical range of change is -54°C to 55°C.
Dwell time: In addition, the dwell time can not be too short, otherwise it is too late to make the product under test produce thermal expansion and contraction stress changes, as for the dwell time, the dwell time of different products is different, you can refer to the relevant specification requirements.
Number of cycles: As for the number of cycles of temperature cyclic stress screening, it is also determined by considering product characteristics, complexity, upper and lower limits of temperature and screening rate, and the screening number should not be exceeded, otherwise it will cause unnecessary harm to the product and cannot improve the screening rate. The number of temperature cycles ranges from 1 to 10 cycles [ordinary screening, primary screening] to 20 to 60 cycles [precision screening, secondary screening], for the removal of the most likely workmanship defects, about 6 to 10 cycles can be effectively removed, in addition to the effectiveness of the temperature cycle, Mainly depends on the temperature variation of the product surface, rather than the temperature variation inside the test box.
There are seven main influencing parameters of temperature cycle:
(1) Temperature Range
(2) Number of Cycles
(3) Temperature Rate of Chang
(4) Dwell Time
(5) Airflow Velocities
(6) Uniformity of Stress
(7) Function test or not (Product Operating Condition)
Temperature Cyclic Stress Screening (2)
Introduction of stress parameters for temperature cyclic stress screening:
The stress parameters of temperature cyclic stress screening mainly include the following: high and low temperature extremum range, dwell time, temperature variability, cycle number
High and low temperature extremal range: the larger the range of high and low temperature extremal, the fewer cycles required, the lower the cost, but can not exceed the product can withstand the limit, do not cause new fault principle, the difference between the upper and lower limits of temperature change is not less than 88°C, the typical range of change is -54°C to 55°C.
Dwell time: In addition, the dwell time can not be too short, otherwise it is too late to make the product under test produce thermal expansion and contraction stress changes, as for the dwell time, the dwell time of different products is different, you can refer to the relevant specification requirements.
Number of cycles: As for the number of cycles of temperature cyclic stress screening, it is also determined by considering product characteristics, complexity, upper and lower limits of temperature and screening rate, and the screening number should not be exceeded, otherwise it will cause unnecessary harm to the product and cannot improve the screening rate. The number of temperature cycles ranges from 1 to 10 cycles [ordinary screening, primary screening] to 20 to 60 cycles [precision screening, secondary screening], for the removal of the most likely workmanship defects, about 6 to 10 cycles can be effectively removed, in addition to the effectiveness of the temperature cycle, Mainly depends on the temperature variation of the product surface, rather than the temperature variation inside the test box.
There are seven main influencing parameters of temperature cycle:
(1) Temperature Range
(2) Number of Cycles
(3) Temperature Rate of Chang
(4) Dwell Time
(5) Airflow Velocities
(6) Uniformity of Stress
(7) Function test or not (Product Operating Condition)
Stress screening fatigue classification:
The general classification of Fatigue research can be divided into High-cycle Fatigue, Low-cycle Fatigue and Fatigue Crack Growth. In the aspect of low cycle Fatigue, it can be subdivided into Thermal Fatigue and Isothermal Fatigue.
Stress screening acronyms:
ESS: Environmental stress screening
FBT: Function board tester
ICA: Circuit analyzer
ICT: Circuit tester
LBS: load board short-circuit tester
MTBF: mean time between failures
Time of temperature cycles:
a.MIL-STD-2164(GJB 1302-90) : In the defect removal test, the number of temperature cycles is 10, 12 times, and in the trouble-free detection it is 10 ~ 20 times or 12 ~ 24 times. In order to remove the most likely workmanship defects, about 6 ~ 10 cycles are needed to effectively remove them. 1 ~ 10 cycles [general screening, primary screening], 20 ~ 60 cycles [precision screening, secondary screening].
B.od-hdbk-344 (GJB/DZ34) Initial screening equipment and unit level uses 10 to 20 loops (usually ≧10), component level uses 20 to 40 loops (usually ≧25).
Temperature variability:
a.MIL-STD-2164(GJB1032) clearly states: [Temperature change rate of temperature cycle 5℃/min]
B.od-hdbk-344 (GJB/DZ34) Component level 15 ° C /min, system 5 ° C /min
c. Temperature cyclic stress screening is generally not specified temperature variability, and its commonly used degree variation rate is usually 5°C/min
EC-35EXT, Superior constant temperature bath (306L)
Project
Type
Series
ＥＸＴ
Function
Temperature occurs in a way
Dry wet bulb method
Temperature range
-70 ～ +150 ℃
Range of temperature
Below the + 100℃
±0.3 ℃
Above the + 101℃
±0.5 ℃
Temperature distribution
Below the + 100℃
±0. 7 ℃
Above the + 101℃
±1.0 ℃
The temperature drops the time
＋125 ～－55 ℃
Within 18 points (10℃ / point average temperature change)
Temperature rise time
－55 ～＋125 ℃
Within 18 minutes (10℃ / minute)
The internal volume of the uterus was tested
306L
Test room inch method (width, depth and height)
630mm × 540mm × 900mm
Product inch method (width, depth and height)
1100mm × 1960mm × 1900mm
Make the material
External outfit
Test room control panel
machine room
Cold interductile steel plate is dark gray
Inside
Stainless steel plate (SUS304,2B polished)
Broken heat material
Test room
Hard synthetic resin
door
Hard synthetic resin foam cotton, glass cotton
Project
Type
Series
ＥＸＴ
Cooling dehumidifying device
Cooling-down method
Mechanical section shrinkage and freezing mode and binary freezing mode
Cooling medium；coolant
Single segment side
R 404A
Binary high temperature / low temperature side
R 404A / R23
Cooling and dehumidifier
Multi-channel mixed heat sink type
The condenser
(water-cooled)
Calorifier
Form
Nickel-chromium heat-resistant alloy heater
Blower
Form
Stir fan
Controller
The temperature is set
-72.0 ～ + 152.0 ℃
Time setting Fanny
0 ~ 999 Time 59 minutes (formula) 0 ~ 20000 Time 59 minutes (formula formula)
Set decomposition energy
Temperature was 0.1℃ for 1 min
Indicate accuracy
Temperature ± 0.8℃ (typ.), time ± 100 PPM
Vacation type
Value or program
Stage number
20-stage / 1 program
The number of procedures
The maximum number of incoming force (RAM) programs is 32 programs
The maximum number of internal ROM programs is 13 programs式
Round-trip number
Max. 98, or unlimited
Number of round-trip repeats
Maximum 3 times
Displace the end
Pt 100Ω ( at 0 ℃ )，grade ( JIS C 1604-1997 )
Control action
When splitting the PID action
Endovirus function
Early delivery function, standby function, setting value maintenance function, power outage protection function,
Power action selection function, maintenance function, transportation round-trip function,
Time delivery function, time signal output function, overrising and overcooling prevention function,
Abnormal representation function, external alarm output function, setting paradigm representation function,
Transport type selection function, the calculation time represents the function, the slot lamp lamp function
Project
Type
Series
ＥＸＨ
Control panel
Equipment machine
LCD operating panel (type contact panel),
Represents lamp (power, transport, abnormal), test power supply terminal, external alarm terminal,
Time signal output terminal, power cord connector
Protective device
Refrigerating cycle
Overload protection device, high blocking device
Calorifier
Temperature over-rise protection device, temperature fuse
Blower
Overload protection device
Control panel
Leakage breaker for power supply, fuse (heater,),
Fuse (for operating loop), temperature rise protection device (for testing),
Temperature rise overcooling prevention device (test material, in microcomputer)
Pay belongs to the product
Test material shed shed by * 8
Stainless steel Shshed (2), shed (4)
Fuse
Operating loop Protection Fuses (2)
Operating specification
( 1 )
Else
Bolus (Cable hole: 1)
Equipment products
Adventitia
Heat-resistant glass: 270mm: 190mm
1
Cable hole
Inner diameter of 50mm
1
The trough inside the lamp
AC100V 15W White hot ball
1
Wheel
6
Horizontal adjustment
6
Electrovirus characteristics
Power supply is * 5.1
AC Three-phase 380V 50Hz
Maximum load current
60A
Capacity of the leakage breaker for the power supply
80A
Sensory current 30mA
Power distribution thickness
60mm２
Rubber insulation hose
Coarseness of grounding wire
14mm２
Cooling water at * 5.3
Water yield
5000 L /h (When the cooling water inlet temperature is 32℃)
water pressure
0.1 ～ 0.5MPa
Side pipe diameter of the device
PT1 1/4
Tubing
Drain-pipe ＊ 5.4
PT1/2
Product weight
700kg
IEC-60068-2 Combined Test of Condensation and Temperature and Humidity
Difference of IEC60068-2 damp heat test specifications
In the IEC60068-2 specification, there are a total of five kinds of humid heat tests, in addition to the common 85℃/85%R.H., 40℃/93%R.H. In addition to fixed-point high temperature and high humidity, there are two more special tests [IEC60068-2-30, IEC60068-2-38], these two are alternating wet and humid cycle and temperature and humidity combined cycle, so the test process will change temperature and humidity, and even multiple groups of program links and cycles, applied in IC semiconductors, parts, equipment, etc. To simulate the outdoor condensation phenomenon, evaluate the material's ability to prevent water and gas diffusion, and accelerate the product's tolerance to deterioration, the five specifications were organized into a comparison table of the differences in the wet and heat test specifications, and the test points were explained in detail for the wet and heat combined cycle test, and the test conditions and points of GJB in the wet and heat test were supplemented.
IEC60068-2-30 alternating humid heat cycle test
This test uses the test technique of maintaining humidity and temperature alternating to make moisture penetrate into the sample and cause condensation (condensation) on the surface of the product to be tested, so as to confirm the adaptability of the component, equipment or other products in use, transportation and storage under the combination of high humidity and temperature and humidity cyclic changes. This specification is also suitable for large test samples. If the equipment and the test process need to keep the power heating components for this test, the effect will be better than IEC60068-2-38, the high temperature used in this test has two (40 ° C, 55 ° C), the 40 ° C is to meet most of the world's high temperature environment, while 55 ° C meets all the world's high temperature environment, the test conditions are also divided into [cycle 1, cycle 2], In terms of severity, [Cycle 1] is higher than [Cycle 2].
Suitable for side products: components, equipment, various types of products to be tested
Test environment: the combination of high humidity and temperature cyclic changes produces condensation, and three kinds of environments can be tested [use, storage, transportation ([packaging is optional)]
Test stress: Breathing causes water vapor to invade
Whether power is available: Yes
Not suitable for: parts that are too light and too small
Test process and post-test inspection and observation: check the electrical changes after moisture [do not take out the intermediate inspection]
Test conditions: Humidity: 95%R.H.[Temperature change after high humidity maintenance](low temperature 25±3℃←→ high temperature 40℃ or 55℃)
Rising and cooling rate: heating (0.14℃/min), cooling (0.08 ~ 0.16℃/min)
Cycle 1: Where absorption and respiratory effects are important features, the test sample is more complex [humidity not less than 90%R.H.]
Cycle 2: In the case of less obvious absorption and respiratory effects, the test sample is simpler [humidity is not less than 80%R.H.]
IEC60068-2 damp heat test specification difference comparison table
For component type parts products, a combination test method is used to accelerate the confirmation of the test sample's resistance to degradation under high temperature, high humidity and low temperature conditions. This test method is different from the product defects caused by respiration [dew, moisture absorption] of IEC60068-2-30. The severity of this test is higher than that of other humid heat cycle tests, because there are more temperature changes and [respiration] during the test, the cycle temperature range is larger [from 55℃ to 65℃], and the temperature change rate of the temperature cycle is faster [temperature rise: 0.14 ° C /min becomes 0.38 ° C /min, 0.08 ° C /min becomes 1.16 ° C /min], in addition, different from the general humid heat cycle, the low temperature cycle condition of -10 ° C is added to accelerate the breathing rate and make the water condensed in the gap of the substitute freeze, which is the characteristic of this test specification. The test process allows the power test and the applied load power test, but it can not affect the test conditions (temperature and humidity fluctuation, rising and cooling rate) because of the heating of the side product after power. Due to the change of temperature and humidity during the test process, there can not be condensation water droplets on the top of the test chamber to the side product.
Suitable for side products: components, metal components sealing, lead end sealing
Test environment: combination of high temperature, high humidity and low temperature conditions
Test stress: accelerated breathing + frozen water
Whether it can be powered on: it can be powered on and external electric load (it can not affect the conditions of the test chamber because of power heating)
Not applicable: Can not replace moist heat and alternating humid heat, this test is used to produce defects different from respiration
Test process and post-test inspection and observation: check the electrical changes after moisture [check under high humidity conditions and take out after test]
Test conditions: damp heat cycle (25 please - 65 + 2 ℃ / 93 + / - 3% R.H.) please - low temperature cycle (25 please - 65 + 2 ℃ / 93 + 3% R.H. - - 10 + 2 ℃) X5cycle = 10 cycle
Rising and cooling rate: heating (0.38℃/min), cooling (1.16 ℃/min)
Heat and humidity cycle (25←→65±2℃/93±3%R.H.)
Low temperature cycle (25←→65±2℃/93±3%R.H. →-10±2℃)
GJB150-09 damp heat test
Instructions: The wet and heat test of GJB150-09 is to confirm the ability of equipment to withstand the influence of hot and humid atmosphere, suitable for equipment stored and used in hot and humid environments, equipment prone to high humidity, or equipment that may have potential problems related to heat and humidity. Hot and humid locations can occur throughout the year in the tropics, seasonally in mid-latitudes, and in equipment subjected to combined pressure, temperature and humidity changes, with special emphasis on 60 ° C /95%R.H. This high temperature and humidity does not occur in nature, nor does it simulate the dampness and heat effect after solar radiation, but it can find the parts of the equipment with potential problems, but it cannot reproduce the complex temperature and humidity environment, evaluate the long-term effect, and can not reproduce the humidity impact related to the low humidity environment.
Relevant equipment for condensation, wet freezing, wet heat combined cycle test: constant temperature and humidity test chamber
AEC-Q100- Failure Mechanism Based on Integrated Circuit Stress Test Certification
With the progress of automotive electronic technology, there are many complicated data management control systems in today's cars, and through many independent circuits, to transmit the required signals between each module, the system inside the car is like the "master-slave architecture" of the computer network, in the main control unit and each peripheral module, automotive electronic parts are divided into three categories. Including IC, discrete semiconductor, passive components three categories, in order to ensure that these automotive electronic components meet the highest standards of automotive anquan, the American Automotive Electronics Association (AEC, The Automotive Electronics Council is a set of standards [AEC-Q100] designed for active parts [microcontrollers and integrated circuits...] and [[AEC-Q200] designed for passive components, which specifies the product quality and reliability that must be achieved for passive parts. Aec-q100 is the vehicle reliability test standard formulated by the AEC organization, which is an important entry for 3C and IC manufacturers into the international auto factory module, and also an important technology to improve the reliability quality of Taiwan IC. In addition, the international auto factory has passed the anquan standard (ISO-26262). AEC-Q100 is the basic requirement to pass this standard.
List of automotive electronic parts required to pass AECQ-100:
Automotive disposable memory, Power Supply step-down regulator, Automotive photocoupler, three-axis accelerometer sensor, video jiema device, rectifier, ambient light sensor, non-volatile ferroelectric memory, power management IC, embedded flash memory, DC/DC regulator, Vehicle gauge network communication device, LCD driver IC, Single power Supply differential Amplifier, Capacitive proximity switch Off, high brightness LED driver, asynchronous switcher, 600V IC, GPS IC, ADAS Advanced Driver Assistance System Chip, GNSS Receiver, GNSS front-end amplifier... Let's wait.
AEC-Q100 Categories and Tests:
Description: AEC-Q100 specification 7 major categories a total of 41 tests
Group A- ACCELERATED ENVIRONMENT STRESS TESTS consists of 6 tests: PC, THB, HAST, AC, UHST, TH, TC, PTC, HTSL
Group B- ACCELERATED LIFETIME SIMULATION TESTS consists of three tests: HTOL, ELFR, and EDR
PACKAGE ASSEMBLY INTEGRITY TESTS consists of 6 tests: WBS, WBP, SD, PD, SBS, LI
Group D- DIE FABRICATION RELIABILITY Test consists of 5 TESTS: EM, TDDB, HCI, NBTI, SM
The group ELECTRICAL VERIFICATION TESTS consist of 11 tests, including TEST, FG, HBM/MM, CDM, LU, ED, CHAR, GL, EMC, SC and SER
Cluster F-Defect SCREENING TESTS: 11 tests, including: PAT, SBA
The CAVITY PACKAGE INTEGRITY TESTS consist of 8 tests, including: MS, VFV, CA, GFL, DROP, LT, DS, IWV
Short description of test items:
AC: Pressure cooker
CA: constant acceleration
CDM: electrostatic discharge charged device mode
CHAR: indicates the feature description
DROP: The package falls
DS: chip shear test
ED: Electrical distribution
EDR: non-failure-prone storage durability, data retention, working life
ELFR: Early life failure rate
EM: electromigration
EMC: Electromagnetic compatibility
FG: fault level
GFL: Coarse/fine air leakage test
GL: Gate leakage caused by thermoelectric effect
HBM: indicates the human mode of electrostatic discharge
HTSL: High temperature storage life
HTOL: High temperature working life
HCL: hot carrier injection effect
IWV: Internal hygroscopic test
LI: Pin integrity
LT: Cover plate torque test
LU: Latching effect
MM: indicates the mechanical mode of electrostatic discharge
MS: Mechanical shock
NBTI: rich bias temperature instability
PAT: Process average test
PC: Preprocessing
PD: physical size
PTC: power temperature cycle
SBA: Statistical yield analysis
SBS: tin ball shearing
SC: Short circuit feature
SD: weldability
SER: Soft error rate
SM: Stress migration
TC: temperature cycle
TDDB: Time through dielectric breakdown
TEST: Function parameters before and after stress test
TH: damp and heat without bias
THB, HAST: Temperature, humidity or high accelerated stress tests with applied bias
UHST: High acceleration stress test without bias
VFV: random vibration
WBS: welding wire cutting
WBP: welding wire tension
Temperature and humidity test conditions finishing:
THB(temperature and humidity with applied bias, according to JESD22 A101) : 85℃/85%R.H./1000h/bias
HAST(High Accelerated stress test according to JESD22 A110) : 130℃/85%R.H./96h/bias, 110℃/85%R.H./264h/bias
AC pressure cooker, according to JEDS22-A102:121 ℃/100%R.H./96h
UHST High acceleration stress test without bias, according to JEDS22-A118, equipment: HAST-S) : 110℃/85%R.H./264h
TH no bias damp heat, according to JEDS22-A101, equipment: THS) : 85℃/85%R.H./1000h
TC(temperature cycle, according to JEDS22-A104, equipment: TSK, TC) :
Level 0: -50℃←→150℃/2000cycles
Level 1: -50℃←→150℃/1000cycles
Level 2: -50℃←→150℃/500cycles
Level 3: -50℃←→125℃/500cycles
Level 4: -10℃←→105℃/500cycles
PTC(power temperature cycle, according to JEDS22-A105, equipment: TSK) :
Level 0: -40℃←→150℃/1000cycles
Level 1: -65℃←→125℃/1000cycles
Level 2 to 4: -65℃←→105℃/500cycles
HTSL(High temperature storage life, JEDS22-A103, device: OVEN) :
Plastic package parts: Grade 0:150 ℃/2000h
Grade 1:150 ℃/1000h
Grade 2 to 4:125 ℃/1000h or 150℃/5000h
Ceramic package parts: 200℃/72h
HTOL(High temperature working life, JEDS22-A108, equipment: OVEN) :
Grade 0:150 ℃/1000h
Class 1:150℃/408h or 125℃/1000h
Grade 2:125℃/408h or 105℃/1000h
Grade 3:105℃/408h or 85℃/1000h
Class 4:90℃/408h or 70℃/1000h
ELFR(Early Life failure Rate, AEC-Q100-008) : Devices that pass this stress test can be used for other stress tests, general data can be used, and tests before and after ELFR are performed under mild and high temperature conditions.
Temperature Cycling Test
Temperature Cycling, in order to simulate the temperature conditions encountered by different electronic components in the actual use environment, changing the ambient temperature difference range and rapid rise and fall temperature change can provide a more stringent test environment, but it must be noted that additional effects may be caused to material testing. For the relevant international standard test conditions of temperature cycle test, there are two ways to set the temperature change. Macroshow Technology provides an intuitive setting interface, which is convenient for users to set according to the specification. You can choose the total Ramp time or set the rise and cooling rate with the temperature change rate per minute.
List of international specifications for temperature cycling tests:
Total Ramp time (min) : JESD22-A104, MIL-STD-8831, CR200315
Temperature variation per minute (℃/min) : IEC 60749, IPC-9701, Bellcore-GR-468, MIL-2164
Example: Lead-free solder joint reliability test
Instructions: For the reliability test of lead-free solder joints, different test conditions will also be different in terms of the temperature change setting mode. For example, (JEDEC JESD22-A104) will specify the temperature change time with the total time [10min], while other conditions will specify the temperature change rate with [10℃/ min], such as from 100 ℃ to 0℃. With a temperature change of 10 degrees per minute, that is to say, the total temperature change time is 10 minutes.
100℃ [10min]←→0℃[10min], Ramp: 10℃/ min, 6500cycle
-40℃[5min]←→125℃ [5min], Ramp: 10min,
200cycle check once, 2000cycle tensile test [JEDEC JESD22-A104]
-40℃(15min)←→125℃(15min), Ramp: 15min, 2000cycle
Example: LED Automotive lighting (High Power LED)
The temperature cycle test condition of LED car lights is -40 ° C to 100 ° C for 30 minutes, the total temperature change time is 5 minutes, if converted into temperature change rate, it is 28 degrees per minute (28 ° C /min).
Test conditions: -40℃(30min)←→100℃(30min), Ramp: 5min
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